Approved by: Graduate Council
Implementation Date: Spring 2016
Note: Deletions are strikethroughs. Insertions are underlined.
Catalog Copy
MEGR 6181. Engineering Metrology. (3) Cross-listed as OPTI 6/8381 Engineering Metrology. Prerequisite: MEGR 3282 or equivalent. Introduction to metrology and standards. Uncertainty, precision and accuracy in metrology. Measurement of size and form, computational methods in measurement of form. Measurement of surface texture and out of roundness. Machine tool and robot accuracy and calibration. Evaluation of screw threads and gears. Introduction to design of precision instruments. Credit will not be awarded for MEGR 6181 where credit has been awarded for MEGR 8181. (Fall)
MEGR 8181. Engineering Metrology. (3) Cross-listed as OPTI 6/8381 Engineering Metrology. Prerequisite: MEGR 3282 or equivalent. Introduction to metrology and standards. Uncertainty, precision and accuracy in metrology. Measurement of size and form, computational methods in measurement of form. Measurement of surface texture and out of roundness. Machine tool and robot accuracy and calibration. Evaluation of screw threads and gears. Introduction to design of precision instruments. Credit will not be awarded for MEGR 8181 where credit has been awarded for MEGR 6181. (Fall)
MEGR 7284. Advanced Surface Metrology. (3) Cross-listed as MEGR 8284 and OPTI 6/8384 Advanced Surface Metrology. Prerequisite: MEGR 6181 or permission of department. Constituents of surface texture, stylus, optical, atomic force microscope and other advanced methods of measuring surface texture. Two and three dimensional measurement of surfaces. Separation of form, waviness and roughness. Random process analysis techniques, use of transforms for filtering. Numerical evaluation of surface texture. Use of surface texture as fingerprint of the process. Relationship between function and surface texture. Credit will not be awarded for MEGR 7284 where credit has been awarded for MEGR 8284. (Fall Spring, Alternate years)
MEGR 8284. Advanced Surface Metrology. (3) Cross-listed as MEGR 7284 and OPTI 6/8384 Advanced Surface Metrology. Prerequisite: MEGR 6181 or permission of department. Constituents of surface texture, stylus, optical, atomic force microscope and other advanced methods of measuring surface texture. Two and three dimensional measurement of surfaces. Separation of form, waviness and roughness. Random process analysis techniques, use of transforms for filtering. Numerical evaluation of surface texture. Use of surface texture as fingerprint of the process. Relationship between function and surface texture. Credit will not be awarded for MEGR 8284 where credit has been awarded for MEGR 7284. (Fall Spring, Alternate years)